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Properties of Electrodeposits, Their Measurement and Significance
  • Language: en
  • Pages: 444
Physics of Thin Films
  • Language: en
  • Pages: 436

Physics of Thin Films

  • Type: Book
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  • Published: 2013-10-22
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  • Publisher: Elsevier

Physics of Thin Films: Advances in Research and Development, Volume 7 is a collection of papers about film growth and structure, optical properties, and semiconducting films. The book covers topics such as diffraction theory; film support and filter fabrication; aging, usage, and cleaning of filters; and properties and applications of III-V compound films. It also discusses topics such as the preparation of use and unbacked metal filters; electromigration in thin films; and the built-up molecular films and their applications. The text is recommended for physicists and engineers involved in thin film physics, especially those who would like to know more about the progresses in the field.

The Physical Principles of Magneto-optical Recording
  • Language: en
  • Pages: 780

The Physical Principles of Magneto-optical Recording

First-time paperback of successful and well-reviewed book; for graduate students and researchers in physics and engineering.

VLSI Electronics: Microstructure
  • Language: en
  • Pages: 223

VLSI Electronics: Microstructure

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification

Rapidly Solidified Alloys
  • Language: en
  • Pages: 804

Rapidly Solidified Alloys

  • Type: Book
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  • Published: 1993-05-20
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  • Publisher: CRC Press

This volume details the principles underlying rapid solidification processing, material structure and properties, and their applications. This practical resource presents a manifold approach to both amorphous and crystalline rapidly solidified metallic alloys.;Written by over 30 internationally acclaimed specialists in their respective fields, Rapidly Solidified Alloys: surveys nucleation and growth studies in undercooled melts; examines various processes for the production of rapidly solidified alloys; discusses the compaction of amorphous alloys; describes surface remelting treatments for the rapid solidification of surface layers and the resultant improved workpiece properties; covers the...

VLSI Electronics: VLSI reliability
  • Language: en
  • Pages: 232

VLSI Electronics: VLSI reliability

  • Type: Book
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  • Published: 1981
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  • Publisher: Unknown

None

High-Speed VLSI Interconnections
  • Language: en
  • Pages: 660

High-Speed VLSI Interconnections

In recent years, customer demands for higher speeds and smaller chips have resulted in the use of interconnections in multilevel and multilayer configurations. Various issues associated with very large scale integrated circuit (VLSIC) interconnections used for high-speed applications are emphasized. Written for those who want to gain a better understanding of the factors associated with modeling, analyzing and simulating high-density, high-speed interconnections, the chapters are designed so that they can be read independently.

Advances in X-Ray Analysis
  • Language: en
  • Pages: 456

Advances in X-Ray Analysis

  • Type: Book
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  • Published: 1981
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  • Publisher: Springer

Deane K. Smith Department of Geosciences The Pennsylvania State University Computer automation of x-ray powder diffraction has been one of the dominant topics of this conference for many years. In fact, the first description of such instrumentation dates back to 1967, Rex (1). The modern instruments are considerably more sophisticated than this early unit, but the goals of automation are essentially unchanged. They are to obtain better data at a faster rate with less effort than is possible with manual instrumentation. Indeed "laziness is the mother of invention. " The emphasis of most of the papers on automation has been tm-lard hardware-controlling systems and aC,"lieving accurate d values...

Microelectronic Reliability: Integrity assessment and assurance
  • Language: en
  • Pages: 568

Microelectronic Reliability: Integrity assessment and assurance

  • Type: Book
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  • Published: 1989
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  • Publisher: Unknown

None

Thin Films for Advanced Electronic Devices
  • Language: en
  • Pages: 352

Thin Films for Advanced Electronic Devices

  • Type: Book
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  • Published: 1991
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  • Publisher: Unknown

In this volume of the highly esteemed Physics of Thin Films serial, focused coverage is given to new trends in solid state devices. Four chapters combine to provide comprehensive discussions of magnetostatic wave phenomena in epitaxial magnetic oxide films and their applications in microwave signal processing devices: Thin-film rare earth transition metal alloys for magnetooptic recording. Two new classes of quantum well structures that have been used for infrared detectors and ultrafast resonant tunneling devices. Recent applications of Fourier transform spectroscopy for the analysis of inorganic thin solid films. This book provides a focused treatment of recent developments in novel thin film solid state components, and specifically discusses magnetic, semiconducting, and optical phenomena.