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Electroceramics - Production, properties and microstructures
Proceedings of the Symposium Held as Part of the Condensed Matter and Materials Physics Conference, on the 20-22 December 1993, at the University of Leeds. The man focus was Electroceramics - Production, properties and microstructures.
Handbook of Low and High Dielectric Constant Materials and Their Applications, Two-Volume Set
Recent developments in microelectronics technologies have created a great demand for interlayer dielectric materials with a very low dielectric constant. They will play a crucial role in the future generation of IC devices (VLSI/UISI and high speed IC packaging). Considerable efforts have been made to develop new low as well as high dielectric constant materials for applications in electronics industries. Besides achieving either low or high dielectric constants, other materials' properties such as good processability, high mechanical strength, high thermal and environmental stability, low thermal expansion, low current leakage, low moisture absorption, corrosion resistant, etc., are of equa...
McDonalds of Perry County, Mississippi
Neil McDonald was born in 1789 in North Carolina. He was living in Greene County, Mississippi by 1818. He married Nancy and they had four children. Traces the descendants of each of these children. Also traces the descendants of Daniel McDonald who was born in 1799 in Cumberland County, North Carolina. He married Harriett Carroll and Harriett Heidelberg. They settled in Perry County in 1819. His son, Francis Marion or "Clubfoot", married three times and had twenty-five children
Electroceramics
"Proceedings of the Symposium held as part of the Condensed Matter and Materials Conference in 1993." Contents include: ferroelectric thin films for integrated device applications; effect of thermal processing conditions on the structure and properties of sol-gel derived PZT thin layers; citrate gel-route processing of ZnO varistors; development and evaluation of oxide cathodes for ceramic fuel cell operation at intermediate temperatures; monitoring the integrity of MOS gate oxides.
The Navy List
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The Medical Register
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