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Carbon Nanotubes: From Basic Research to Nanotechnology
The book comprises reviews on various topics of carbon nanotube research from specialists in the field, together with reports on on-going research. Both are intended to give a detailed picture of the remarkable properties of these one-dimensional nanostructures. Particular attention is paid to the synthesis, characterization, properties, and application of nanotubes. The book will be an indispensable introduction for the newcomers in the field as well as a valuable update for researchers in the field, for it contains the most recent developments.
Frontiers of Multifunctional Integrated Nanosystems
Proceedings of the NATO Advanced Research Workshop, Illmenau, Germany from 12 to 16 July 2003
DNA-Based Molecular Electronics
The conference focuses on the various applications of DNA for future molecular electronics. The main topics are the characterization of DNA conductivity, modification of DNA in order to generate biotemplated nanowires, and the use of DNA to connect or position other nanostructures such as carbon nanotubes.
Frontiers of Multifunctional Nanosystems
Proceedings of the NATO Advanced Research Workshop on Frontiers in Molecular-Scale Science and Technology of Fullerence, Nanotube, Nanosilicon, Biopolymer (DNA, Protein) Multifunctional Nanosystems, Kyiv, Ukraine, 9-12 September 2001
DNA-Based Molecular Construction
The Workshop combined different fields of molecular nanotechnology applying DNA either as subject of studies or as a molecular building block. As the first meeting solely focusing on DNA-nanotechnology, the heterogeneous scientific background of the participants in physics, chemistry, and biology provided a comprehensive account of the state-of-the-art in this multidisciplinary field and previewed the trends for further research in this promising field.
Stress-Induced Phenomena in Metallization
These proceedings contain new research results and advances in basic understanding of stress-induced phenomena in metallization. Papers cover results on electromigration, thermal stresses and void formation in copper-low k interconnect structures.
Stress Induced Phenomena in Metallization
Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These "metallizations" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.
The Cumulative Book Index
A world list of books in the English language.
Book Review Index
Vols. 8-10 of the 1965-1984 master cumulation constitute a title index.
Review of Progress in Quantitative Nondestructive Evaluation
All papers were peer reviewed. These proceedings provide the latest research and development papers in Nondestructive Evaluation (NDE) and its applications to flaw detection, material properties, and structural reliability. The papers are prepared by a line-up of internationally known researchers and are reviewed by qualified scientists. Papers cover recent developments in essentially all measuring techniques (ultrasonic, electromagnetic, x-rays, thermal, acoustic emission, etc.) and their applications to flaw detection and structural reliability.
