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This book includes original, peer-reviewed research papers from the 11th International Conference on Modelling, Identification and Control (ICMIC2019), held in Tianjin, China on July 13-15, 2019. The topics covered include but are not limited to: System Identification, Linear/Nonlinear Control Systems, Data-driven Modelling and Control, Process Modelling and Process Control, Fault Diagnosis and Reliable Control, Intelligent Systems, and Machine Learning and Artificial Intelligence.The papers showcased here share the latest findings on methodologies, algorithms and applications in modelling, identification, and control, integrated with Artificial Intelligence (AI), making the book a valuable asset for researchers, engineers, and university students alike.
This book constitutes the refereed proceedings of the Second International Conference on Information Computing and Applications, ICICA 2010, held in Qinhuangdao, China, in October 2011. The 97 papers presented were carefully reviewed and selected from numerous submissions. They are organized in topical sections on computational economics and finance, computational statistics, mobile computing and applications, social networking and computing, intelligent computing and applications, internet and Web computing, paralelle and distributed computing, and system simulation and computing.
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This volume contains the proceedings of the International Conference on Inf- mation Computing and Applications (ICICA 2010), which was held in Tangshan, China, October 15-18, 2010. As future-generation information technology, information computing and applications become specialized, information computing and applications - cluding hardware, software, communications and networks are growing with ever-increasing scale and heterogeneity and becoming overly complex. The c- plexity is getting more critical along with the growing applications. To cope with the growing and computing complexity, information computing and applications focus on intelligent, selfmanageable, scalable computing systems ...
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Selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China.