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Pyramidal Systems for Computer Vision
This book contains the proceedings of the NATO Advanced Research Workshop held in Maratea (Italy), May 5-9, 1986 on Pyramidal Systems for Image Processing and Computer Vision. We had 40 participants from 11 countries playing an active part in the workshop and all the leaders of groups that have produced a prototype pyramid machine or a design for such a machine were present. Within the wide field of parallel architectures for image processing a new area was recently born and is growing healthily: the area of pyramidally structured multiprocessing systems. Essentially, the processors are arranged in planes (from a base to an apex) each one of which is generally a reduced (usually by a power o...
Wafer-Level Integrated Systems
From the perspective of complex systems, conventional Ie's can be regarded as "discrete" devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach...
Reconfigurable Massively Parallel Computers
Offers guidance on three areas of the complex world of reconfigurable massively parallel computers - architecture, mapping algorithms to the architecture and fault-tolerance. The material is addressed to students and professionals interested in the exploitation of array processing.
Defect and Fault Tolerance in VLSI Systems
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Proceedings
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1993 Computer Architectures for Machine Perception
Proceedings of the Computer Architectures for Machine Perception Workshop held Dec. 15-17, 1993 in New Orleans, Louisiana. Papers came from several communities: computer architecture; pattern recognition; image processing and analysis; computer vision; and VLSI. No index. Annotation copyright Book N
