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Diffraction and Imaging Techniques in Material Science P2
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It...
Methods of Surface Analysis
Methods of Surface Analysis deals with the determination of the composition of surfaces and the identification of species attached to the surface. The text applies methods of surface analysis to obtain a composition depth profile after various stages of ion etching or sputtering. The composition at the solid—solid interface is revealed by systematically removing atomic planes until the interface of interest is reached, in which the investigator can then determine its composition. The book reviews the effect of ion etching on the results obtained by any method of surface analysis including the effect of the rate of etching, incident energy of the bombarding ion, the properties of the solid,...
Characterization of Metal and Polymer Surfaces V1
Characterization of Metal and Polymer Surfaces, Volume 1: Metal Surfaces presents the proceedings of the Symposium on Advances in Characterization of Metal and Polymer Surfaces, held in New York, on April 5–8, 1976. This book provides information pertinent to surface science and discusses the applications of surface analyses to polymer technology. Organized into five parts encompassing 19 chapters, this compilation of papers starts with an overview of the important innovations of surface analyses and discusses the possible applications of each method to polymer technology. This text then explores atom-probe field ion microscopy, which is the most sensitive micro-analytical tool that combines the single atom resolution of a field ion microscope with mass spectrometric single ion identification. Other chapters discuss the application of Mössbauer spectroscopy as a technique for studying corrosion phenomena. The final chapter deals with the capabilities and limitations of the method of inelastic electron tunnelling. This book is a valuable resource for analytical and polymer chemists.
Mechanic and Dielectric Properties
Mechanic and Dielectric Properties deals with the mechanical and dielectric properties of thin films. Topics covered range from the deposition and mechanical properties of superlattice thin films to the preparation of hard coatings by sputtering and arc evaporation. The use of thin films in microwave acoustics is also discussed, along with ferroelectric films for integrated electronics and the physics, chemistry, and technology of electrochromic tungsten-oxide-based thin films. Comprised of five chapters, this volume begins with an analysis of the growth, characterization, and mechanical behavior of films comprising multilayers primarily of metal and refractory metallic compound components. ...
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