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Design and Test Technology for Dependable Systems-on-Chip
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Progresses in Artificial Intelligence and Neural Systems
This book provides an overview of the current advances in artificial intelligence and neural nets. Artificial intelligence (AI) methods have shown great capabilities in modelling, prediction and recognition tasks supporting human–machine interaction. At the same time, the issue of emotion has gained increasing attention due to its relevance in achieving human-like interaction with machines. The real challenge is taking advantage of the emotional characterization of humans’ interactions to make computers interfacing with them emotionally and socially credible. The book assesses how and to what extent current sophisticated computational intelligence tools might support the multidisciplinary research on the characterization of appropriate system reactions to human emotions and expressions in interactive scenarios. Discussing the latest recent research trends, innovative approaches and future challenges in AI from interdisciplinary perspectives, it is a valuable resource for researchers and practitioners in academia and industry.
FPGAs and Parallel Architectures for Aerospace Applications
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.
Applications of Evolutionary Computing
This book constitutes the joint refereed proceedings of six workshops on evolutionary computing, EvoWorkshops 2004, held together with EuroGP 2004 and EvoCOP 2004 in Coimbra, Portugal, in April 2004. The 55 revised full papers presented were carefully reviewed and selected from a total of 123 submissions. In accordance with the six workshops covered, the papers are organized in topical sections on evolutionary bioinformatics; evolutionary computing in communications, networks, and connected systems; hardware optimization techniques; evolutionary computing in image analysis and signal processing; evolutionary music and art; and evolutionary algorithms in stochastic and dynamic environments.
Semiconductor Devices in Harsh Conditions
This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.
Radiation Effects in Semiconductors
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation proble...
ELECTRIMACS 2019
This book collects a selection of papers presented at ELECTRIMACS 2019, the 13th international conference of the IMACS TC1 Committee, held in Salerno, Italy, on 21st-23rd May 2019. The conference papers deal with modelling, simulation, analysis, control, power management, design optimization, identification and diagnostics in electrical power engineering. The main application fields include electric machines and electromagnetic devices, power electronics, transportation systems, smart grids, electric and hybrid vehicles, renewable energy systems, energy storage, batteries, supercapacitors and fuel cells, and wireless power transfer. The contributions included in Volume 1 are particularly focused on electrical engineering simulation aspects and innovative applications.
Soft Errors in Modern Electronic Systems
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architec...
CMOSET Fall 2009 Final Program
Final program for the CMOSET Fall 2009 conference.
Apostle of Rome
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