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Selected Proceedings from the 233rd ECS Meeting Seattle, WA – Spring 2018
  • Language: en
  • Pages: 1666

Selected Proceedings from the 233rd ECS Meeting Seattle, WA – Spring 2018

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Processes at the Semiconductor-Solution Interface 4
  • Language: en
  • Pages: 236

Processes at the Semiconductor-Solution Interface 4

The symposium consisted of four half-day sessions on topics at the forefront of semiconductor electrochemistry and solution-based processing including etching, patterning, passivation, porosity formation, electrochemical film growth, energy conversion materials, deposition, semiconductor surface functionalization, photoelectrochemical and optical properties, and other related processes. This issue of ECS Transactions contains 18 of the papers presented including invited papers by H. Föll (Christian-Albrechts University Kiel), J. N. Chazalviel (Ecole Polytechnique, CNRS), D. N. Buckley (University of Limerick, and Past President, ECS), J. D. Holmes (University College Cork), E. Chassaing (IRDEP, EDF-CNRS-ENSCP).

Pits & Pores 8: Nanomaterials – Fabrication, Properties, and Applications
  • Language: en
  • Pages: 125
Stress Related Phenomena in Electrochemical Systems
  • Language: en
  • Pages: 59

Stress Related Phenomena in Electrochemical Systems

The papers included in this issue of ECS Transactions were originally presented in the symposium ¿Stress Related Phenomena in Electrochemical Systems¿, held during the 212th meeting of The Electrochemical Society, in Washington, DC, from October 7 to 12, 2007.

Proceedings of the Grand Lodge of Free and Accepted Masons of the State of New York
  • Language: en
  • Pages: 636